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Leveraging our proprietary DoD SBIR-developed
NIADTM technology*, we support our clients with:


Materials R&D
Technology Acceleration & Qualifications
Process Characterization & Analysis
Yield Analysis & Enhancement
Failure/Degradation Mechanism Analysis, and
IC Fingerprinting & Forensic Analysis

*Nanostructural Imaging & Analytical Diagnostic (NIADTM) Technology

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Our Past and Present Clients
Teledyne Imaging Sensors, FLIR Systems, Lockheed Martin (SB Focal Plane), BAE Systems, DRS Technologies, Raytheon Vision Systems, Motorola, ST-Microelectronics, Texas Instruments, Rockwell (Conexant), International Rectifier, Westinghouse, Medtronic (Micro-Rel), Tokyo Electron, Microchip Technology, Honeywell, Lockheed Martin, ASM Epitaxy, Read-Rite, General Motors, Exxon, IC Engineering, EMCORE, Tegal, TRW (Northrop Grumman), Northrop Grumman, Speedfam (Novellus Systems), ATMI Materials, Maxim Integrated Products, US Air Force, Boeing Satellite Systems, Hughes Research Labs, RJ Mears, Phiar, Astralux, Raytheon Space & Airborne Systems, AGI Abbie Gregg, Freescale

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